LEE, W.; KIM, C.; LEE, J.; PARK, S.; ROH, Y. The study on un-doped/boron doped/un-doped triple SEG in vertical NAND flash memory. Journal of Metals, Materials and Minerals, Bangkok, Thailand, v. 31, n. 4, p. 40-44, 2021. Disponível em: http://jmmm.material.chula.ac.th/index.php/jmmm/article/view/1137. Acesso em: 25 jan. 2022.