POOLCHARUANSIN, P.; CHANAPAI, N. Non-destructive silicon quantification in low-level Si-doped diamond-like carbon films. Journal of Metals, Materials and Minerals, Bangkok, Thailand, v. 36, n. 4, p. e2538, 2026. DOI: 10.55713/jmmm.v36i4.2538. Disponível em: https://jmmm.material.chula.ac.th/index.php/jmmm/article/view/2538. Acesso em: 19 sep. 2026.