SEESOMDEE, C.; PIENPINIJTHAM, P. .; RAKPONGSIRI, P. .; TUNGASMITA, S. Enhanced Raman spectroscopy analysis for contamination detection on microelectronic devices using gold nanoclusters grown by DC magnetron sputtering. Journal of Metals, Materials and Minerals, Bangkok, Thailand, v. 33, n. 3, p. 1665, 2023. DOI: 10.55713/jmmm.v33i3.1665. Disponível em: https://jmmm.material.chula.ac.th/index.php/jmmm/article/view/1665. Acesso em: 17 jul. 2024.