[1]
C. SEESOMDEE, P. . PIENPINIJTHAM, P. . RAKPONGSIRI, and S. TUNGASMITA, “Enhanced Raman spectroscopy analysis for contamination detection on microelectronic devices using gold nanoclusters grown by DC magnetron sputtering”, J Met Mater Miner, vol. 33, no. 3, p. 1665, Aug. 2023.