POOLCHARUANSIN P, CHANAPAI N. Non-destructive silicon quantification in low-level Si-doped diamond-like carbon films. J Met Mater Miner [Internet]. 2026 Sep. 17 [cited 2026 Sep. 19];36(4):e2538. Available from: https://jmmm.material.chula.ac.th/index.php/jmmm/article/view/2538