Dependence of electrical resistivity on plastic deformation in copper-aluminum alloy Cu<sub>0.975</sub>Al<sub>0.025</sub>
We measure changes of electrical resistivity after a plastic deformation. We supposed that the changes are due to a large density of dislocation present in the polycrystalline samples; therefore, we also measure the amount of dislocations after the plastic deformation. Thus, for our aim, we elaborated copper-aluminum alloys Cu0.975Al0.025; next, with them, we fabricated metallographic specimens, which were submitted to traction subsequently. We measured the electrical resistivity before and after the traction. The obtained results are discussed in a theoretical framework of dislocations.
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