Dependence of electrical resistivity on plastic deformation in copper-aluminum alloy Cu<sub>0.975</sub>Al<sub>0.025</sub>

Authors

  • J G Miranda Ramos San Marcos University
  • E Medrano Atencio San Marcos University
  • M Quiroga Agurto San Marcos University
  • F A Reyes Navarro San Marcos University

Abstract

We measure changes of electrical resistivity after a plastic deformation. We supposed that the changes are due to a large density of dislocation present in the polycrystalline samples; therefore, we also measure the amount of dislocations after the plastic deformation. Thus, for our aim, we elaborated copper-aluminum alloys Cu0.975Al0.025; next, with them, we fabricated metallographic specimens, which were submitted to traction subsequently. We measured the electrical resistivity before and after the traction. The obtained results are discussed in a theoretical framework of dislocations.

Downloads

Download data is not yet available.

Downloads

Published

2017-01-17

How to Cite

[1]
J. G. Miranda Ramos, E. Medrano Atencio, M. Quiroga Agurto, and F. A. Reyes Navarro, “Dependence of electrical resistivity on plastic deformation in copper-aluminum alloy Cu<sub>0.975</sub>Al<sub>0.025</sub>”, J. Met. Mater. Miner., vol. 26, no. 2, Jan. 2017.

Issue

Section

Original Research Articles