Enhanced Raman spectroscopy analysis for contamination detection on microelectronic devices using gold nanoclusters grown by DC magnetron sputtering

ผู้แต่ง

  • Charin SEESOMDEE International Program of Nanoscience and Technology, Graduated School, Chulalongkorn University, Bangkok, Thailand
  • Prompong PIENPINIJTHAM Department of Chemistry, Faculty of Science, Chulalongkorn University, Bangkok, Thailand
  • Pornchai RAKPONGSIRI Western Digital Storage Technologies (Thailand) Ltd., Phra Nakhon Si Ayutthaya, Thailand
  • Sukkaneste TUNGASMITA International Program of Nanoscience and Technology, Graduated School, Chulalongkorn University, Bangkok, Thailand; Department of Physics, Faculty of Science, Chulalongkorn University, Bangkok, Thailand

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https://doi.org/10.55713/jmmm.v33i3.1665

คำสำคัญ:

Surface-enhanced Raman scattering, Sputtering, Gold nanoclusters, Failure analysis

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ประวัติผู้แต่ง

Prompong PIENPINIJTHAM, Department of Chemistry, Faculty of Science, Chulalongkorn University, Bangkok, Thailand

 

 

Pornchai RAKPONGSIRI, Western Digital Storage Technologies (Thailand) Ltd., Phra Nakhon Si Ayutthaya, Thailand

 

 

Sukkaneste TUNGASMITA, International Program of Nanoscience and Technology, Graduated School, Chulalongkorn University, Bangkok, Thailand; Department of Physics, Faculty of Science, Chulalongkorn University, Bangkok, Thailand

 

 

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2023-08-08

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Original Research Articles